Quantitative AES and XPS: Tests of Theory Using AES and XPS Databases with REELS Background Subtraction

Characterization of tungsten tips for STM by SEM/AES/XPS

For the first time, both X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques were applied in analysis of surface contamination of electrochemically etched Scanning Tunneling Microscope (STM) tungsten tips. Carbon monoxide, graphite, tungsten carbide and tungsten oxide were found as main surface contaminations of STM tungsten tips. The thickness of tungsten ox...

Quantitative AES, XPS and RBS determination of intergranular bismuth coverage in copper bicrystals at 500 °C

1 Centre Science des Matériaux et des Structures, Ecole Nationale Supérieure des Mines de Saint-Etienne, CNRS PECM UMR 5146, 158, cours Fauriel, F-42023 Saint-Etienne cedex 02, France 2 Ecole Polytechnique Fédérale de Lausanne (EPFL), Laboratoire de Métallurgie Mécanique, Station 12, CH-1015 Lausanne, Switzerland 3 Laboratoire Pierre SÜE (CEA/CNRS), UMR9956 CEA/SACLAY, F-91191 Gif Sur Yvette Ce...

XPS and AES studies of UHTC ZrB2-SiC-Si3N4 treated with solar energy

Chemical state quantification of iron and chromium oxides using XPS: the effect of the background subtraction method

Quantitative chemical analysis based on X-ray photoelectron spectroscopy (XPS) includes elemental identification and, in many cases, quantification of the chemical states of active surface atoms. The two main parts of the analysis are subtracting the inelastic background and fitting a synthetic lineshape to the data. The analysis of transition metal oxides is typically based on their core level...

XPS MultiQuant: multimodel XPS quantification software

A program for quantitative evaluation of x-ray photoelectron spectra has been developed to serve as a practical tool for surface chemists. The program uses the ‘classic’ approach of quantification and requires as input the integrated intensities of the measured XPS lines. The usual correction methods and factors can be applied and controlled independently. All necessary basic data for calculati...